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Thin Film Systems

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  • JEOL JSM-6400F Scanning Electron Microscope (SEM)

    €10.000,00
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    JEOL JSM 6400F is a field-emission scanning electron microscope (FESEM) designed for observance of biological and nanomaterials using techniques such as imaging, electron diffraction, chemical analysis, and 3D imaging. It offers a range of applications, and is well-suited for imaging and analyzing the structure and composition of biological films and nanomaterials.

    Tool has been decommissioned at a Dutch University in working condition, and was well packed and currently stored in The Netherlands. Can be shipped immediately. Pricing is based on as-is, where-is condtion. Please contact us for any questions.

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