Thin Film Systems

JEOL JSM 6400F is a field-emission scanning electron microscope (FESEM) designed for observance of biological and nanomaterials using techniques such as imaging, electron diffraction, chemical analysis, and 3D imaging. It offers a range of applications, and is well-suited for imaging and analyzing the structure and composition of biological films and nanomaterials.

Tool has been decommissioned at a Dutch University in working condition, and was well packed and currently stored in The Netherlands. Can be shipped immediately. Pricing is based on as-is, where-is condtion. Please contact us for any questions.